TLA-M series course experiment kit

TLA-M series course lab kit for NI myDAQ/myRIO, lab software using DAQWare for NI DAQmx* for myDAQ.

Hardware applicable: NI myDAQ

Software: DAQWare for NI DAQmx

TLA-001M Circuit Principles Course Lab Kit

serial numberExperimental ProjectsNI myDAQNI myRIO
1Mapping the volt-ampere characteristics of circuit components
2Verification of Kirchhoff's law
3Verification of the superposition principle
4Verification of Davignan's and Norton's theorems
5Experimental study of controlled sources VCVS, VCCS, CCVS, CCCS*
6Response testing of RC first order circuits
7A study of second-order dynamic circuit response
8Study of series resonant circuits of R, L, and C
9RC frequency selective network characterization
10Measurement of impedance characteristics of R, L and C components
*Requires the use of a 2nd lab kit

TLA-002M Analog Circuit Course Lab Kit

serial numberExperimental ProjectsNI myDAQNI myRIO
1Transistor Single-Stage Amplifier Circuit
2Transistor two-stage amplifier circuit
3Transistor Negative Feedback Amplifier Circuit
4Transistor emitter follower
5Transistor Differential Amplifier Circuit
6Operational Amplifier Proportional Summing Operational Circuit
7Integral and Differential Circuits
8Waveform generation circuit
9active filter
10voltage comparator
11IC RC Sine Wave Oscillator
12Integrated Voltage Regulator Experiment
13Waveform converter circuit
14Field Effect Transistor Amplifier Circuit

TLA-003M Digital Circuit Course Experiment Kit

serial numberExperimental ProjectsNI myDAQNI myRIO
1Gate Logic Functions and Tests
2Combinatorial logic circuits Ⅰ (half adder, full adder)
3Combination Circuit II (Decoder and Data Selector)
4flip-flop (electronics)
5Timing circuits (counters, shift registers)
6Design and logic function verification of combinational logic circuits
7D/A, A/D converter
8Application of 555 time base circuits
9Integrated Circuits Multiple Counters Combined Application

TLA-004M Sensor Course Lab Kit

serial numberExperimental ProjectsmyDAQmyRIO
1Photoresistor Characterization Experiment
2Silicon photovoltaic cell characterization experiment
3Photodiode Characterization Experiment
4Phototransistor Characterization Experiment
5PIN diode characterization experiment*
6Experiments on the Characterization of Pyroelectric Infrared Sensors
7DC motor speed measurement experiment based on slot photocoupler
8Hall IC-based DC motor speed measurement and speed control experiment
9Thermistor temperature measurement experiment
10LM35 temperature measurement experiment
11Thermocouple temperature measurement experiment
12Relative Humidity Measurement Experiment
13AD592 temperature measurement experiment
14Experiments on the Characterization of Metal Foil Strain Gauges
15Electret microphone audio measurement experiment
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TLA-005M Signal and System Course Lab Kit

serial numberExperimental ProjectsNI myDAQNI myRIO
1Zero Input Response and Zero State Response
2Synthesis and decomposition of signals
3Second order series resonance and parallel resonance
4First Order Network Characterization Measurements
5Second-order network characterization measurements
6Feedback systems and system frequency response characteristics
7Experiments with second-order Butterworth filters
8Signal Sampling and Recovery
9RC Oscillator Characteristics

TLA-007E Automatic Control Principles Course Experiment Kit

serial numberExperimental ProjectsNI myDAQNI myRIO
1Typical link circuit simulation experiment
2Dynamic performance and stability analysis of typical systems
3Typical Link Frequency Characteristics Measurements
4Linear system series correction
5Static characteristics of a typical nonlinear link
6Phase plane method for analyzing nonlinear systems
7Functional description of nonlinear systems
8Arbitrary configuration of control system poles
9Sampling system analysis
10Analog PID control experiment
11DC motor speed measurement and PID control experiment
12Temperature measurement and PID control experiment
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