DAQWare for MCC

TLA developed DAQWare for MCC based on theMCC USB-230Series of data acquisition cards, deployed with enhanced experimental instrumentation functions, are able to cover the desktop application of the laboratory for the main engineering education engineering courses. It provides dual-channel oscilloscopes, dual-channel function oscilloscopes, dual-channel programmable DC voltage regulators and voltmeters required for experimental teaching. In addition, it fully supports the series of course lab kits released by TLA. DAQWare for MCC provides support for specific experimental projects required by the complete TLA series of course lab kits.

The MCC USB230 series of multifunction data acquisition cards, manufactured by Measurement Computing Corporation (theMCC). MCC was acquired by National Instruments (NI) in 2005 and is now incorporated into theDigilenetSales Channel.

MCC USB230The series of multi-function data acquisition cards include USB-231 and USB-234 models. It provides 8 single-ended/4 differential analog input channels of 16-bit ADC (sampling rate: 50kS/s or 100kS/s), 2 synchronous analog output channels of 16-bit DAC (sampling rate 5kS/s), 8 digital I/O and 1 counter input.

TLA-004C Sensor Course Lab Kit
Figure 1 TLA-004C Sensor Course Experiment Kit

TLA-001C Circuit Principles Course Experiment Kit Experimental Items

serial numberExperimental ProjectsUSB-231\USB-234
1Mapping the volt-ampere characteristics of circuit components
2Verification of Kirchhoff's law
3Verification of the superposition principle
4Verification of Davignan's and Norton's theorems
5Experimental study of controlled sources VCVS, VCCS, CCVS, CCCS*
6Response testing of RC first order circuits
7A study of second-order dynamic circuit response
8Study of series resonant circuits of R, L, and C
9RC frequency selective network characterization
10Measurement of impedance characteristics of R, L and C components

TLA-002C Analog Circuit Course Experiment Kit Experimental Items

serial numberExperimental ProjectsUSB-231\USB-234
1Transistor Single-Stage Amplifier Circuit
2Transistor two-stage amplifier circuit
3Transistor Negative Feedback Amplifier Circuit
4Transistor emitter follower
5Transistor Differential Amplifier Circuit
6Operational Amplifier Proportional Summing Operational Circuit
7Integral and Differential Circuits
8Waveform generation circuit
9active filter
10voltage comparator
11IC RC Sine Wave Oscillator
12Integrated Voltage Regulator Experiment
13Waveform converter circuit
14Field Effect Transistor Amplifier Circuit

TLA-003C Digital Circuit Course Experiment Kit Experimental Items

serial numberExperimental ProjectsUSB-231\USB-234
1Gate Logic Functions and Tests
2Combinatorial logic circuits Ⅰ (half adder, full adder)
3Combination Circuit II (Decoder and Data Selector)
4flip-flop (electronics)
5Timing circuits (counters, shift registers)
6Design and logic function verification of combinational logic circuits
7D/A, A/D converter
8Application of 555 time base circuits
9Integrated Circuits Multiple Counters Combined Application

TLA-004C Sensor Principle Course Experiment Kit Experimental Items

serial numberExperimental ProjectsUSB-231\USB-234
1Photoresistor Characterization Experiment
2Silicon photovoltaic cell characterization experiment
3Photodiode Characterization Experiment
4Phototransistor Characterization Experiment
5PIN diode characterization experiment*
6Experiments on the Characterization of Pyroelectric Infrared Sensors
7DC motor speed measurement experiment based on slot photocoupler
8Hall IC-based DC motor speed measurement and speed control experiment
9Thermistor temperature measurement experiment
10LM35 temperature measurement experiment
11Thermocouple temperature measurement experiment
12Relative Humidity Measurement Experiment
13AD592 temperature measurement experiment
14Experiments on the Characterization of Metal Foil Strain Gauges
15Electret microphone audio measurement experiment

TLA-007C Principles of Automatic Control Course Experiment Kit Experimental Items

serial numberExperimental ProjectsUSB-231\USB-234
1Typical link circuit simulation experiment
2Dynamic performance and stability analysis of typical systems
3Typical Link Frequency Characteristics Measurements
4Linear system series correction
5Static characteristics of a typical nonlinear link
6Phase plane method for analyzing nonlinear systems
7Functional description of nonlinear systems
8Arbitrary configuration of control system poles
9Sampling system analysis
10Analog PID control experiment
11DC motor speed measurement and PID control experiment

DAQWare for MCC is deployed based on the MCC InstaCal driver tool and the LabVIEW 2015 development environment. Please read the following instructions carefully before use.

1. Download DAQWare for MCC toolkit and unzip it to get two folders, MCC_InstaCal and Ware for MCC install, which correspond to MCC InstaCal driver and SDK and DAQWare for MCC installation files respectively.

2. Run MCC_InstaCal.exe to start installing MCC_InstaCal driver and SDK.

3. Run setup.exe in the DAQWare for MCC Install folder to install DAQWare for MCC.

4. After completing the installation, connect the MCC USB-231 to the computer where the above software is installed via USB, and correctly install the TLA-001C Principles of Circuits Course Lab Kit, TLA-002C Analog Circuits Course Lab Kit, TLA-003C Digital Circuits Course Lab Kit, TLA-004C Sensors Course Lab Kit, or TLA-007C Automated Controls Course Lab Kit. Principles of Circuits course lab kit.

5. Before running DAQWare for MCC, you need to run InstaCal. select the connected USB DAQ device and configure the input channel to differential mode, confirm.

6. Find the DAQWare for MCC shortcut in the Windows Start directory and run it.

7, the program will run after the interface shown in Figure 1.

Figure 2 DAQWare for MCC interface1
Fig. 3 Example of DAQWare for MCC interface 2 (spontaneous sweep signal + self-receiving)

In the lab desktop application environment, students can conduct experiments using DAQWare for MCC. As in Figure 4, it is also possible to participate in sensor experiments based on the ULx API as well as the LabVIEW programming environment throughout.

Figure 4 ULx API

DAQWare for MCC Instll (with ICalUL 6.7.4)

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